Exclusive

Publication

Byline

Location

US Patent Issued to Feinmetall on Sept. 22 for "Longitudinally shiftable electrically conductive contact device" (German Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,813, issued on Sept. 22, was assigned to Feinmetall GmbH (Herrenberg, Germany). "Longitudinally shiftable electrically conductive contact ... Read More


US Patent Issued to SEMIGHT INSTRUMENTS on Sept. 22 for "Probe mounting structure and reliability test system for wafer-level reliability test" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,814, issued on Sept. 22, was assigned to SEMIGHT INSTRUMENTS Co. LTD (Suzhou, China). "Probe mounting structure and reliability test syste... Read More


US Patent Issued to Sandisk Technologies on Sept. 22 for "Small device testing using thermesthesiometer" (Indian Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,815, issued on Sept. 22, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Small device testing using thermesthesiometer" was... Read More


US Patent Issued to YISHI INDUSTRIAL on Sept. 22 for "Test environment control system" (Taiwanese Inventor)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,816, issued on Sept. 22, was assigned to YISHI INDUSTRIAL Co. LTD (Miaoli County, Taiwan). "Test environment control system" was invented ... Read More


US Patent Issued to SAMSUNG ELECTRONICS on Sept. 22 for "Semiconductor device and semiconductor package" (South Korean Inventor)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,817, issued on Sept. 22, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor device and semiconductor pac... Read More


US Patent Issued on Sept. 22 for "Dynamic load pull tuner support for on-wafer testing" (Canadian Inventor)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,818, issued on Sept. 22. "Dynamic load pull tuner support for on-wafer testing" was invented by Christos Tsironis (Kirkland, Canada). Acc... Read More


US Patent Issued to Keithley Instruments on Sept. 22 for "Solderless high current, high voltage, high bandwidth test fixture" (Ohio Inventor)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,819, issued on Sept. 22, was assigned to Keithley Instruments LLC (Solon, Ohio). "Solderless high current, high voltage, high bandwidth te... Read More


US Patent Issued to SAMSUNG ELECTRONICS on Sept. 22 for "Systems and methods for intelligent management of a battery" (South Korean, Indian Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,821, issued on Sept. 22, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Systems and methods for intelligent manage... Read More


US Patent Issued to HONDA MOTOR on Sept. 22 for "State-of-charge estimation method" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,822, issued on Sept. 22, was assigned to HONDA MOTOR Co. LTD (Tokyo). "State-of-charge estimation method" was invented by Hiroto Okabe (To... Read More


US Patent Issued to NUVOTON TECHNOLOGY CORPORATION JAPAN on Sept. 22 for "Voltage measurement device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,823, issued on Sept. 22, was assigned to NUVOTON TECHNOLOGY CORPORATION JAPAN (Kyoto, Japan). "Voltage measurement device" was invented by... Read More